15–16 Sept 2011
Paul Scherrer Institut, Villigen, Switzerland
Europe/Zurich timezone

A High-Resolution RIXS Spectrometer Using an Energy-Compensation Principle

17 Sept 2011, 16:30
30m
WBGB/019 (PSI)

WBGB/019

PSI

Talk Resonant Inelastic and Elastix X-ray Scattering Resonant Inelastic and Elastic X-ray Scattering

Speaker

Dr D J Huang (National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan)

Description

Resonant inelastic resonant soft x-ray scattering (RIXS) is an effective spectro-scopic method for unraveling electronic structures of solids, because of recent technological advances in synchrotron radiation sources and beamlines. NSRRC has designed and constructed an experimental setup of RIXS in the soft x-ray re-gime. Ray-tracing results show that the efficiency of a RIXS setup with an active grating monochromator (AGM) and an active grating spectrometer (AGS) is higher than that of a conventional design by nearly two orders of magnitude, while a high spectral resolution is maintained. Our commissioning results show that the total energy resolution of RIXS system is ~ 140 meV at the energy of 930 eV. Here we will present the design concept and commissioning results of RIXS on transition-metal oxides such as NiO, La2CuO4 and 1D spin systems with the new AGM-AGS RIXS setup.

Please specify poster or talk

Talk

Please specify the session

RIXS

Primary author

Dr D J Huang (National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan)

Presentation materials

There are no materials yet.