Welcome

• Mario Ferianis (Elettra)

Elettra 2.0 & its diagnostics

• Silvano Bassanese (Elettra)

Brief description of new machine and desired Optical Diagnostics

X-ray Emittance Monitors at ALBA

• Ubaldo Iriso (ALBA)

Beam Profile Measurements using (Visible) Synchrotron Radiation Interferometry

• Laura Torino (ALBA-CELLS)

Monitoring beam emittance and beam relative energy spread at MAX IV

• Ake Andersson (MAX IV)

Beam size monitoring at SLS (2.0)

• Cigdem Ozkan Loch (PSI - Paul Scherrer Institut)

Currently at the SLS, visible light is used to measure the vertical beam size using the pi-polarization technique. At SLS 2.0, this is not going to meet the requirements. So we looked at other possibilities and discovered other challenges. This presentation invites you to discuss "the good, the bad, and the ugly" of the proposed solution.

An X-ray beam property analyzer for next generation light sources

• Nazanin Samadi (PSI - Paul Scherrer Institut)

SLS

Integral or Bunch Selective or even 2D: Interferometric Beam Profiling @ BESSY II

• Gregor Schiwietz

Optical beam diagnostics at BESSY II is being upgraded towards bunch selective measurements at three new beamlines for visible light and THz using two bending magnets. Developments are focused on several directions + time resolution + spatial resolution + correlated 2D capabilities (for "time" vs. "x" or alternatively "y" as well as for "x" vs. "y") + data acquisition time / illumination rate The current status will be discussed including lessons that we have learned

Closing day 1

• Mario Ferianis (Elettra)

Emittance diagnostics at ESRF-EBS using the X-ray Pinhole Camera

• Friederike Ewald (ESRF)

Soleil

• Marie Labat (SOLEIL)

Emittance Diagnostics at PETRA IV

• Gero Kube (DESY)
• Marco Marongiu (DESY)