Speaker
Christoph Bostedt
(PSI - Paul Scherrer Institut)
Description
The intense X-ray pulses from free-electron laser sources (XFEL) allow imaging of single nanometer sized samples with single shots. In my talk I will briefly introduce XFELs and the single-shot imaging capabilities of free-flying particles at SwissFEL. I will then present a few showcase examples for studying the (static) morphology of nanoparticles and following light-induced processes on the nanoscale. I will finish with first applications of single-shot imaging to atmospherically relevant systems.