Investigating Beam-Induced Electron Emission from Thin Wires in Proton Beams and Bias Voltage Influence

by Mr Jerome Touguet

Monday 16 Dec 2024, 16:00 → 17:00 Europe/Zurich

019 (WBGB)

Abstract:
The emission of electrons induced by beam interaction with thin targets is a critical phenomenon used to measure various properties of particle beams. Among these mechanisms, thermionic emission plays a significant role in shaping electron behavior and influencing measurement accuracy. A common technique to suppress this emission involves applying a bias voltage to the wire, recapturing low-energy electrons. This study investigates these mechanisms under the influence of bias voltage and their impact on the measurement process for high-brightness proton beams from the HIPA accelerator. Through experiments and simulations, the study aims to better understand the emission spectra, the suppression of thermionic emission, and the effects of beam fields on electron dynamics.

presntation_16_12_2024_Touguet.pptm