Speaker
Description
The Charge Coupled Device (CCD) has been the detector of choice in recent years for Resonant Inelastic X-ray Scattering (RIXS) beamlines. Recent advances using Electron Multiplying CCDs has meant that individual low energy X-rays can be centroided to obtain a spatial resolution of <5 µm. The RIXS application will be outlined and the state of the art results described from XCAM’s RIXSCam which incorporates up to 3 EMCCDs, operating at a pixel readout rate of up to 10 MHz allowing high resolution while maintaining throughput, with up to 3 fps operation. The low noise (<1 e-rms) allows for individual soft X-ray events in the range 0.3-3 keV to be detected and centroided.
We have developed an X-ray beamline to enable resolution measurements to be conducted. In house measurements on the RIXSCam will be presented showing a spatial resolution FWHM of 3.95 µm. Recent results of a single detector RIXSCam operating at the NanoTerasu synchrotron has achieved a system resolution of 16 meV at 930 eV.
CCD technology is limited due to the relatively long readout time required. Work is underway to investigate the effectiveness of CMOS detectors for use in soft X-ray RIXS in the near future. There are a number of candidates, including the CIS304 from Te2v which has an imaging area of 45x45 mm2 with 10 µm pixels operating at ~20 fps, as well as the LTN/HWK detector from Fairchild which has 4.6 µm and operates at 120 fps. We present preliminary X-ray results for both detectors.