12–15 Sept 2017
ETH Zurich
Europe/Zurich timezone

Oblique Incidence Effect in X-ray Phase Contrast Imaging using High Aspect Ratio Gratings

13 Sept 2017, 12:30
2h
HG (ETH Zurich)

HG

ETH Zurich

Rämistrasse 101 8092 Zurich Switzerland
Board: FAME-001
Poster Fabrication Methods Lunch break & Poster session

Speaker

Dr Satoshi Sano (Shimadzu Corporation)

Author

Dr Satoshi Sano (Shimadzu Corporation)

Co-authors

Mr Akira Horiba (Shimadzu Corporation) Dr Keishi Kitamura (Shimadzu Corporation) Mr Kenji Kimura (Shimadzu Corporation) Mr Koichi Tanabe (Shimadzu Corporation) Dr Naoki Morimoto (Shimadzu Corporation) Mr Takahiro Doki (Shimadzu Corporation) Mr Takanori Yoshimuta (Shimadzu Corporation) Taro Shirai (Shimadzu Corporation)

Presentation materials

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