X-ray and Neutron Phase Imaging with Gratings 2017

Name: X-ray and Neutron Phase Imaging with Gratings 2017
Start: 2017-09-11T17:00:00+02:00
End: 2017-09-15T14:00:00+02:00
Location: ETH Zurich

12–15 Sept 2017

ETH Zurich

Europe/Zurich timezone

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Group photo shot on Tuesday, 12 September 2017

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XNPIG2017@psi.ch

Extending the Aspect Ratio of Etched Silicon for Precision Electro-coating with Gold to Fabricate XPCI Analyzer Gratings

13 Sept 2017, 12:30

HG (ETH Zurich)

HG

ETH Zurich

Rämistrasse 101 8092 Zurich Switzerland

Poster Fabrication Methods Lunch break & Poster session

Patrick Finnegan (Sandia National Laboratories)

Dr Amber Dagel (Sandia National Laboratories) Andrew Hollowell (Sandia National Laboratories) Dr Carlos Perez (Sandia National Laboratories) Christian Arrington (Sandia National Laboratories) Dr Jonathan Coleman (Sandia National Laboratories)

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X-ray and Neutron Phase Imaging with Gratings 2017

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Extending the Aspect Ratio of Etched Silicon for Precision Electro-coating with Gold to Fabricate XPCI Analyzer Gratings

HG

ETH Zurich

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X-ray and Neutron Phase Imaging with Gratings 2017

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