12–15 Sept 2017
ETH Zurich
Europe/Zurich timezone

Talbot-Lau X-Ray Deflectometry with Flash X-Ray Sources for Density Measurements in Dynamic Experiments

14 Sept 2017, 16:40
20m
HG E3 (ETH Zurich)

HG E3

ETH Zurich

Rämistrasse 101 8092 Zurich Switzerland
Talk Materials science Materials Science - 02

Speaker

Dr Daniel Clayton (National Security Technologies, LLC)

Author

Dr Daniel Clayton (National Security Technologies, LLC)

Co-authors

Mr Andrew Smith (National Security Technologies, LLC) Dr Dan Stutman (Johns Hopkins University) Mr David Schwellenbach (National Security Technologies, LLC) Dr Kevin Tritz (Johns Hopkins University) Dr Maria Pia Valdivia (Johns Hopkins University)

Presentation materials

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