5–7 Jul 2012
ETH Zürich
Europe/Zurich timezone

Session

Indirect detection

7 Jul 2012, 09:00
F7 (ETH Zürich)

F7

ETH Zürich

Presentation materials

There are no materials yet.

  1. Dr Federica Marone (PSI)
    07/07/2012, 09:00
    Indirect detection
    Synchrotron based X-ray tomographic microscopy (SRXTM) is a technique to unravel the 3D internal structure and composition of opaque samples in a non-destructive manner at the micrometer scale. Thanks to its versatility, it can be used to investigate a variety of specimens and dynamic processes, spanning a wide range of spatial, temporal and density resolutions as well as sample sizes....
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  2. Dr Thierry MARTIN (ESRF)
    07/07/2012, 09:25
    Indirect detection
    The indirect detection scheme is based on a converter screen, front-optics and an imaging camera. This low-cost and low-risk solution based on commercial components is used on all synchrotron radiation sources for beam visualization and beam movement monitoring, and intensively for imaging applications. The indirect detection systems require a compromise between these conflicting parameters: ...
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