7–12 Sept 2025
PSI
Europe/Zurich timezone

Study on the Radiation Damage of VUV-sensitive MPPC in Liquid Xenon

9 Sept 2025, 16:37
1m
Outside Auditorium and Tent

Outside Auditorium and Tent

Poster presentation Poster Session and BBQ

Speaker

Ryusei Umakoshi (University of Tokyo)

Description

A Multi-Pixel Photon Counter (MPPC) sensitive to vacuum ultraviolet (VUV) light, called VUV-MPPC, is used in the liquid xenon (LXe) gamma-ray detector for the MEG II experiment. In the MEG II runs with high intensity muon beam, the degradation of VUV-MPPC's photon detection efficiency (PDE) to VUV light was observed. The cause of PDE degradation is considered due to a surface damage of VUV-MPPC by the irradiation of the muon beam. The plausible candidate radiation sources make the radiation damage are gamma-ray and VUV photon but we couldn’t specify which radiation sources make that damage yet. To elucidate the cause of the PDE degradation, we irradiated a VUV-MPPC with the comparable amount of VUV photons as in the MEG II experiment in LXe. In this presentation, we present the results of the reproduction test of PDE degradation for the VUV-MPPC.

Author

Ryusei Umakoshi (University of Tokyo)

Co-authors

Kensuke Yamamoto (The University of Tokyo) Lukas Gerritzen (University of Tokyo) Sei Ban (ICEPP, The university of Tokyo) Prof. Toshinori Mori (The University of Tokyo) Toshiyuki Iwamoto (The University of Tokyo) Wataru Ootani (Univ. of Tokyo)

Presentation materials

There are no materials yet.