3–7 Jul 2011
ETH Zurich, Switzerland
Europe/Zurich timezone

The DEPFET Sensor with Signal Compression: a High-Speed Large Format X-ray Imaging Detector for the European XFEL

6 Jul 2011, 11:55
20m
WHGA/001 (PSI)

WHGA/001

PSI

Oral presentation Free Electron Lasers Free Electron Lasers

Speaker

Dr Christian Sandow (PNSensor GmbH, Munich, Germany)

Description

The DSSC detector system, which is currently under development for the European XFEL, will be able to record X-ray frames with 1 Megapixel at a rate of 4.5MHz. The system is based on a silicon pixel sensor with a newly developed DEPFET as the central amplifier structure. The sensor will have a size of 200x200 mm2 and will be read out by 256 ASICs which are bump-bonded to the detector in order to provide full parallel readout. The signals from the sensor, after being processed by an analog filter, are digitized by 8-bit ADCs and locally stored in an SRAM. In order to fit the dynamic range of 104 photons of 1 keV per pixel into the input range of the ASIC while simultaneously achieving single photon resolution at 1keV, a strong signal compression is required. This compression is achieved by a non-linear characteristic which is inherent to a new DEPFET structure that combines an enhanced charge handling capacity with the excellent noise performance of the DEPFET. The main building blocks of the system will be discussed with a special emphasis on sensor development and simulations. Moreover, we will present measurements with prototype readout ASICs and standard DEPFETs that have shown a very low noise which makes it is possible to achieve the targeted single photon resolution for 1keV photons at a frame rate of 4.5MHz.

Primary author

Dr Christian Sandow (PNSensor GmbH, Munich, Germany)

Co-author

Dr Matteo Porro (Max-Planck-Institut Halbleiterlabor, Munich, Germany)

Presentation materials

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