3D-crystallography on the solid support at the SwissFEL submicron focus experimental station

Fixed-target serial X-ray crystallography in in-situ chips and on low-Z polymer sample supports

26 Jan 2015, 11:10

20m

OSGA / EG06 (Paul Scherrer Institut)

Speaker

Dr Michael Heymann (CFEL)

Presentation materials

Slides

SwissFEL_3DxtallographyWorkshop_Heymann.pdf