Speaker
Benoit Roche
(ESRF)
Description
We have acquired 2 XBS-FE modules from iTech to perform tests with real beam signals and to evaluate their performance for enhancing the long‑term stability of the Spark electronics, and in particular by reducing their dependence on hardware temperature.
The tests were performed by controlling the switching with an home-made controller, with software‑based compensation applied externally. Switching was performed at a low frequency, each full cycle lasting 8 seconds.
The results of these tests are presented here.
Author
Benoit Roche
(ESRF)