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13th Diagnostics Experts of European Light Sources (DEELS)

23–24 Mar 2026
Paul Scherrer Institute
Europe/Zurich timezone

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Session

Session

24 Mar 2026, 14:30
Paul Scherrer Institute

Paul Scherrer Institute

PSI CH, PSI, Forschungsstrasse 111, 5232 Villigen,

Conveners

Session: 6

  • Volker Schlott (PSI - Paul Scherrer Institut)

Presentation materials

There are no materials yet.

  1. 11. Single bunch phase measurement
    Benoit Roche (ESRF)
    24/03/2026, 14:30
    Presentation

    Accurate knowledge of the longitudinal phase of individual bunches relative to a reference RF signal is essential for applications that demand tight synchronization, such as bunch‑by‑bunch transverse or longitudinal feedback systems. While many beam‑phase diagnostics exist, they are not always optimal with sparse‑filling or single‑bunch operation.

    Here we would like to discuss a method for...

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  2. 25. Overview of Silicon Carbide detector for synchrotron environments
    Gabriele Trovato (University of Catania)
    24/03/2026, 14:55
    Presentation

    Silicon carbide (SiC) sensors have been widely validated as compact, radiation-hard, and high-resolution X-ray beam diagnostics elements, able to perform in-line beam intensity and position monitoring with minimal perturbation of the photon beam.
    The intrinsic properties of SiC as a wide-bandgap semiconductor, thermal and radiation resistant, with a silicon-like industrial maturity, make it...

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  3. 16. Complexities in Designing Front-end XBPMs for APPLE Insertion Devices for Diamond-II
    Samuel Jackson (Diamond Light Source)
    24/03/2026, 15:20
    Presentation

    With the move to a 4th generation light source for Diamond-II, modifications to the front-end X-ray beam position monitors (XBPMs) are required to prevent damage due to the higher power loads. Several Diamond beamlines use advanced planar polarized light emitting (APPLE) undulators, which provide variable polarisation of the X-ray beam, including circular polarisation to minimise on-axis power...

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  4. 32. Status and Prospects of Readout and Control Systems for Real-Time X-ray Beam Monitoring at SenSiC GmbH
    Massimo Camarda (SenSiC GmbH)
    24/03/2026, 15:45
    Presentation

    SenSiC GmbH is a Swiss technology company delivering advanced Silicon Carbide (SiC)–based
    sensor solutions and customized electronics for high-brilliance X-ray and particle beam diagnostics.
    Originating as a spin-out of the R&D activities of the Swiss Light Source (PSI), SenSiC designs and
    manufactures ultra-compact, radiation-hard beam position (XBPM) and intensity monitors tailored...

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