3–7 Jul 2011
ETH Zurich, Switzerland
Europe/Zurich timezone

Characterisation and image correction of Hamamatsu C9730DK-10 flat panel X-ray imaging detector

4 Jul 2011, 16:01
1m
HG E7 (ETH Zurich, Switzerland)

HG E7

ETH Zurich, Switzerland

www.ethz.ch www.psi.ch
Poster presentation Imaging theory Poster Mini Talks II

Speaker

Dr Josef Uher (CSIRO PSE)

Description

CMOS flat panels are becoming standard equipment of X-ray micro-imaging laboratories. It is a mature technology that provides very good spatial resolution, dynamic range and large sensitive area. An example of such detector is the Hamamatsu C9730DK-10 flat panel. It comprises of a CsI:Tl scintillator directly deposited on the two-dimensional photodiode array (pixel size of 50 x 50 µm, total sensitive area 52.8 x 52.8 mm). The charge accumulated in each pixel is transferred to amplifiers and converted to a voltage signal. The analogue signal is subsequently digitized by a 14-bit analogue-to-digital converter and sent to PC via USB interface. The modulation transfer function, linearity, dynamic range and signal-to-noise ratio were measured and compared with manufacturer’s specifications where applicable. The signal-to-thickness calibration is an image correction method that replaces the standard flat field correction. It was originally developed for the single photon counting detectors Medipix. The signal-to-thickness calibration method was implemented in our in-house software platform for use with the flat panel. Performance of this correction method and a set of sample images corrected by the signal-to-thickness calibration will be presented.

Primary author

Dr Josef Uher (CSIRO PSE)

Co-author

Dr James Tickner (CSIRO PSE)

Presentation materials