Speaker
Mr
Zaprazny Zdenko
(Slovak Academy of Sciences)
Description
Modern laboratory X-ray imaging systems with microfocus source and CCD camera give us the possibility to move some of modern imaging techniques from synchrotrons to laboratories. Spatially coherent X-rays emited from microfocus source traverse a sample with phase shift. Beam deflection induced by the local change of refractive index may be expressed as dark-bright contrast on the edges in final projection. These phenomena lead to increase of spatial resolution of X-ray projections but may also lead to unpleasant artifacts in computerized tomography (CT) unless reconstruction program can separate phase and absorption contributions. In this contribution several results of phase constrast imaging are presented.
Primary author
Mr
Zaprazny Zdenko
(Slovak Academy of Sciences)
Co-authors
Dr
Ac Vladimir
(Alexander Dubček University of Trenčín)
Dr
Korytar Dusan
(Slovak Academy of Sciences)
