September 5, 2022
Paul Scherrer Institute
Europe/Zurich timezone

Soft X-Ray Spectromicroscopy for Nanoscale Chemical Characterization at the SIM Beamline of the SLS

Sep 5, 2022, 11:00 AM
20m
The education center, SZ-OSGA/EG06 (Paul Scherrer Institute)

The education center, SZ-OSGA/EG06

Paul Scherrer Institute

Speaker

Armin Kleibert (PSI, SIM beamline, photo-emission electron microscopy)

Presentation materials

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