15–16 Sept 2011
Paul Scherrer Institut, Villigen, Switzerland
Europe/Zurich timezone

Magnetical Characterization of o-LuMnO3 and TbMnO3 thin films

16 Sept 2011, 12:31
2m
WSLA - Foyer (Paul Scherrer Institut, Villigen, Switzerland)

WSLA - Foyer

Paul Scherrer Institut, Villigen, Switzerland

Board: 68
Poster Poster Session II (Friday) Poster session II and lunch

Speaker

Mr Matthias Bator (Paul Scherrer Institut)

Description

Magnetoelectrics, materials with ferromagnetism and -electricity in the same phase gained a lot of interest with the discovery of materials with improved properties. A strong coupling, caused by the magnetic-ordering induced polarization, has been found in orthorhombic rare-earth manganates. These materials are of large interest for basic research as well as for applications like high-sensitivity sensors and novel storage materials. TbMnO3 and LuMnO3 were grown as thin films on (110) YAlO3 by pulsed laser deposition. XRD has shown phase pure growth and good crystalline quality. The epitaxial growth introduces strain as a parameter, thus allows to investigate the multiferroic properties as a function of the structural parameters and temperature. For a 90nm LuMnO3 thin film a magnetic Bragg peak, characteristic for an E-type AFM structure, was observed by neutron diffraction, an important improvement for neutron scattering characterization of thin films. Polarized neutron reflectometry points to the existence of a strain-induced ferromagnetism at the substrate/film interface. This is also evidenced by depth-dependent spin-dynamics measured by low energy muon spin spectrometry.

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Multiple Order Parameter Systems

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Poster

Primary author

Mr Matthias Bator (Paul Scherrer Institut)

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