Speaker
Dr
Marco Cantoni
(School of Basic Sciences, EPF Lausanne, 1015 Lausanne, Switzerland)
Description
The introduction of silicon drift detectors (SDD) made new applications in electron microscopy possible. Larger detector areas lead to higher collection angles and thus to a higher detection efficiency. Faster electronics improved the overall detection rate. Count rates of 100'000 cts/sec and more have become possible. Improved low energy sensitivity and the increased number of counts (for a given time) allow a better light element and trace element analysis. Dramatically reduced acquisition times for elemental mapping (minutes instead of hours) have made it possible to perform 3D elemental analysis in FIB/SEM tomography.
In some transmission electron microscopes detector elements are integrated into the pole piece and allow high speed and artefact free analysis of even single atom columns. Tilt-series tomography based on X-ray intensity maps allow the reconstruction of complex chemical microstructures in 3D.
Please specify poster or talk
Talk
Please specify the session
Advancing quantitative chemical imaging
Primary author
Dr
Marco Cantoni
(School of Basic Sciences, EPF Lausanne, 1015 Lausanne, Switzerland)
