Speaker
Description
PAL-XFEL first started supporting regular user experiments in mid 2017, and total 6 instruments are currently operating at two hard X-ray (XSS: X-ray Scattering and Spectroscopy and NCI: Nano Crystallography and Imaging) and one soft X-ray (SSS: Soft X-ray Scattering and Spectroscopy) beamlines. The HX beamline provides more than 1011 photons/pulse in the range from 2.2 to 15 keV with maximum repetition rate of 60 Hz, and about 1012 photons/pulse in the range from 200 to 1200 eV are delivered at the SX beamline.
All the way from XFEL tuning to the end of the user beamtime, photon beam diagnostics is an essential part of the beamline operation. This presentation includes overview of photon beam diagnostic devices at the PAL-XFEL to monitor intensity, position, spectrum, and arrival timing of the XFEL pulses.
