Conveners
Coherence, Profile and Position Measurements
- Rasmus Ischebeck (Paul Scherrer Institut)
Description
Session 7
After the first decade of operability, the strong quest for results around the Free Electron Laser (FEL) facilities has been positively filled, giving the opportunity to make one step back from the sample-level and to focus on subtle, still open topics concerning the FEL source metrology and coherence characterization. Because of the complexity of the emission process, important parameters...
A delay of the electron beam with respect to the FEL radiation field can be used for auto-correlation measurements since the phase is imprinted both in the radiation field as well as the microbunching. As long as the delay is within the coherence length of the SASE spikes there is interference, resulting in a modulation of the output power, similar to a phase shifter. For longer delays the...
Characterization of XFEL beams can be challenging, requiring the use of several different types of detectors to measure beam properties. Sensors fabricated using electronic grade single crystal diamond have been shown to have rapid response and enable measurement of signals over a wide dynamic range for synchrotron beams. To study the utility for measurement of XFEL beams, flux linearity and...
